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"A Robust Solution for Embedded Memory Test and Repair."
K. Darbinyan et al. (2011)
- K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462
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