


default search action
"350nm CMOS test-chip for architecture verification of real-time QVGA ..."
Takashi Morimoto et al. (2004)
- Takashi Morimoto, Yohmei Harada, Tetsushi Koide, Hans Jürgen Mattausch:
350nm CMOS test-chip for architecture verification of real-time QVGA color-video segmentation at the 90nm technology node. ASP-DAC 2004: 531-532

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.