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"Theoretic analysis and enhanced X-tolerance of test response compact based ..."

Yinhe Han et al. (2005)

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DOI: 10.1145/1120725.1120743

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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  dblp key:
  - conf/aspdac/HanHLL05
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/HanHLL05
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li:
Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code. ASP-DAC 2005: 53-58

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