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"A new short-channel-effect-degraded subthreshold behavior model for ..."
Te-Kuang Chiang et al. (2017)
- Te-Kuang Chiang, Ying-Wen Ko, Hong-Wun Gao, Yeong-Her Wang:
A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET. ASICON 2017: 520-524
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