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"Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in ..."

Lucas A. Tambara et al. (2015)

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DOI: 10.1007/978-3-319-16214-0_28

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-10

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  - conf/arc/TambaraARKBF15
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Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda Lima Kastensmidt, Giovanni Bruni, Christopher Frost:
Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. ARC 2015: 331-338

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