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"VLSI layout hotspot detection based on discriminative feature extraction."

Hang Zhang et al. (2016)

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DOI: 10.1109/APCCAS.2016.7804024

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Hang Zhang, Haoyu Yang, Bei Yu, Evangeline F. Y. Young:
VLSI layout hotspot detection based on discriminative feature extraction. APCCAS 2016: 542-545

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