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ORCIDBei Yu 0001
Person information
- affiliation: Chinese University of Hong Kong, Department of Computer Science and Engineering, Hong Kong
- affiliation (PhD 2014): University of Texas at Austin, Department of Electrical and Computer Engineering, TX, USA
Other persons with the same name
- Bei Yu — disambiguation page
- Bei Yu 0002
![[0000-0001-5425-0011]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0001-5425-0011")
— Syracuse University, School of Information Studies, NY, USA (and 1 more)
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2020 – today
- 2021
[j43]Xiaowei Xu, Xinyi Zhang, Bei Yu, Xiaobo Sharon Hu, Christopher Rowen, Jingtong Hu, Yiyu Shi:
DAC-SDC Low Power Object Detection Challenge for UAV Applications. IEEE Trans. Pattern Anal. Mach. Intell. 43(2): 392-403 (2021)- 2020
- [j42]Xingquan Li, Bei Yu, Jianli Chen, Wenxing Zhu:
DSA guiding template assignment with multiple redundant via and dummy via insertion. Integr. 70: 32-42 (2020) - [j41]Qi Xu, Song Chen, Hao Geng, Bo Yuan, Bei Yu, Feng Wu, Zhengfeng Huang:
Fault tolerance in memristive crossbar-based neuromorphic computing systems. Integr. 70: 70-79 (2020) - [j40]Haoyu Yang, Shuhe Li, Zihao Deng, Yuzhe Ma, Bei Yu, Evangeline F. Y. Young:
GAN-OPC: Mask Optimization With Lithography-Guided Generative Adversarial Nets. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2822-2834 (2020) - [j39]Hao Geng, Wei Zhong, Haoyu Yang, Yuzhe Ma, Joydeep Mitra, Bei Yu:
SRAF Insertion via Supervised Dictionary Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2849-2859 (2020) - [j38]Grace Li Zhang, Bing Li, Meng Li, Bei Yu, David Z. Pan, Michaela Brunner, Georg Sigl, Ulf Schlichtmann:
TimingCamouflage+: Netlist Security Enhancement With Unconventional Timing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4482-4495 (2020) - [j37]Yuzhe Ma, Wei Zhong, Shuxiang Hu, Jhih-Rong Gao, Jian Kuang, Jin Miao, Bei Yu:
A Unified Framework for Simultaneous Layout Decomposition and Mask Optimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 5069-5082 (2020) - [j36]Qi Xu, Hao Geng, Song Chen, Bei Yu, Feng Wu:
Memristive Crossbar Mapping for Neuromorphic Computing Systems on 3D IC. ACM Trans. Design Autom. Electr. Syst. 25(1): 8:1-8:19 (2020) - [j35]Kang Liu, Haoyu Yang, Yuzhe Ma, Benjamin Tan, Bei Yu, Evangeline F. Y. Young, Ramesh Karri, Siddharth Garg:
Adversarial Perturbation Attacks on ML-based CAD: A Case Study on CNN-based Lithographic Hotspot Detection. ACM Trans. Design Autom. Electr. Syst. 25(5): 48:1-48:31 (2020) - [c87]Haoyu Yang, Wei Zhong, Yuzhe Ma, Hao Geng, Ran Chen, Wanli Chen, Bei Yu:
VLSI Mask Optimization: From Shallow To Deep Learning. ASP-DAC 2020: 434-439 - [c86]Wei Li, Jialu Xia, Yuzhe Ma, Jialu Li, Yibo Lin, Bei Yu:
Adaptive Layout Decomposition with Graph Embedding Neural Networks. DAC 2020: 1-6 - [c85]Wei Zhong, Shuxiang Hu, Yuzhe Ma, Haoyu Yang, Xiuyuan Ma, Bei Yu:
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization. DAC 2020: 1-6 - [c84]Wanli Chen, Xinge Zhu, Ruoqi Sun, Junjun He, Ruiyu Li, Xiaoyong Shen, Bei Yu:
Tensor Low-Rank Reconstruction for Semantic Segmentation. ECCV (17) 2020: 52-69 - [c83]Ran Chen, Yong Liu, Mengdan Zhang, Shu Liu, Bei Yu, Yu-Wing Tai:
Dive Deeper into Box for Object Detection. ECCV (22) 2020: 412-428 - [c82]Hao Geng, Haoyu Yang, Lu Zhang, Jin Miao, Fan Yang, Xuan Zeng, Bei Yu:
Hotspot Detection via Attention-based Deep Layout Metric Learning. ICCAD 2020: 16:1-16:8 - [c81]Guojin Chen, Wanli Chen, Yuzhe Ma, Haoyu Yang, Bei Yu:
DAMO: Deep Agile Mask Optimization for Full Chip Scale. ICCAD 2020: 19:1-19:9 - [c80]Bentian Jiang, Lixin Liu, Yuzhe Ma, Hang Zhang, Bei Yu, Evangeline F. Y. Young:
Neural-ILT: Migrating ILT to Neural Networks for Mask Printability and Complexity Co-optimization. ICCAD 2020: 20:1-20:9 - [c79]Qi Sun, Arjun Ashok Rao, Xufeng Yao, Bei Yu, Shiyan Hu:
Counteracting Adversarial Attacks in Autonomous Driving. ICCAD 2020: 83:1-83:7 - [c78]Zhuolun He, Yuzhe Ma, Lu Zhang, Peiyu Liao, Ngai Wong, Bei Yu, Martin D. F. Wong:
Learn to Floorplan through Acquisition of Effective Local Search Heuristics. ICCD 2020: 324-331 - [c77]Husheng Zhou, Wei Li, Zelun Kong, Junfeng Guo, Yuqun Zhang, Bei Yu, Lingming Zhang, Cong Liu:
DeepBillboard: systematic physical-world testing of autonomous driving systems. ICSE 2020: 347-358 - [c76]Junpeng Wang, Qi Xu, Bo Yuan, Song Chen, Bei Yu, Feng Wu:
Reliability-Driven Neural Network Training for Memristive Crossbar-Based Neuromorphic Computing Systems. ISCAS 2020: 1-4 - [c75]Yuzhe Ma, Zhuolun He, Wei Li, Lu Zhang, Bei Yu:
Understanding Graphs in EDA: From Shallow to Deep Learning. ISPD 2020: 119-126 - [i35]Grace Li Zhang, Bing Li, Meng Li, Bei Yu, David Z. Pan, Michaela Brunner, Georg Sigl, Ulf Schlichtmann:
TimingCamouflage+: Netlist Security Enhancement with Unconventional Timing (with Appendix). CoRR abs/2003.00862 (2020) - [i34]Haocheng Li, Satwik Patnaik, Abhrajit Sengupta, Haoyu Yang, Johann Knechtel, Bei Yu, Evangeline F. Y. Young, Ozgur Sinanoglu:
Attacking Split Manufacturing from a Deep Learning Perspective. CoRR abs/2007.03989 (2020) - [i33]Ran Chen, Yong Liu, Mengdan Zhang, Shu Liu, Bei Yu, Yu-Wing Tai:
Dive Deeper Into Box for Object Detection. CoRR abs/2007.14350 (2020) - [i32]Wanli Chen, Xinge Zhu, Ruoqi Sun, Junjun He, Ruiyu Li, Xiaoyong Shen, Bei Yu:
Tensor Low-Rank Reconstruction for Semantic Segmentation. CoRR abs/2008.00490 (2020) - [i31]Guojin Chen, Wanli Chen, Yuzhe Ma, Haoyu Yang, Bei Yu:
DAMO: Deep Agile Mask Optimization for Full Chip Scale. CoRR abs/2008.00806 (2020)
2010 – 2019
- 2019
- [j34]Qianru Zhang, Meng Zhang, Tinghuan Chen, Zhifei Sun, Yuzhe Ma, Bei Yu:
Recent advances in convolutional neural network acceleration. Neurocomputing 323: 37-51 (2019) - [j33]Song Chen, Qi Xu, Bei Yu:
Adaptive 3D-IC TSV Fault Tolerance Structure Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(5): 949-960 (2019) - [j32]Derong Liu, Bei Yu, Vinicius S. Livramento, Salim Chowdhury, Duo Ding, Huy Vo, Akshay Sharma, David Z. Pan:
Synergistic Topology Generation and Route Synthesis for On-Chip Performance-Critical Signal Groups. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(6): 1147-1160 (2019) - [j31]Haoyu Yang, Jing Su, Yi Zou, Yuzhe Ma, Bei Yu, Evangeline F. Y. Young:
Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(6): 1175-1187 (2019) - [j30]Meng Li, Kaveh Shamsi, Travis Meade, Zheng Zhao, Bei Yu, Yier Jin, David Z. Pan:
Provably Secure Camouflaging Strategy for IC Protection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(8): 1399-1412 (2019) - [j29]Meng Li, Bei Yu, Yibo Lin, Xiaoqing Xu, Wuxi Li, David Z. Pan:
A Practical Split Manufacturing Framework for Trojan Prevention via Simultaneous Wire Lifting and Cell Insertion. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(9): 1585-1598 (2019) - [j28]Yuzhe Ma, Subhendu Roy, Jin Miao, Jiamin Chen, Bei Yu:
Cross-Layer Optimization for High Speed Adders: A Pareto Driven Machine Learning Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(12): 2298-2311 (2019) - [c74]Wei Li, Yuzhe Ma, Qi Sun, Yibo Lin, Iris Hui-Ru Jiang, Bei Yu, David Z. Pan:
OpenMPL: An Open Source Layout Decomposer: Invited Paper. ASICON 2019: 1-4 - [c73]Haoyu Yang, Piyush Pathak, Frank Gennari, Ya-Chieh Lai, Bei Yu:
Detecting multi-layer layout hotspots with adaptive squish patterns. ASP-DAC 2019: 299-304 - [c72]Xingquan Li, Bei Yu, Jianli Chen, Wenxing Zhu:
A local optimal method on DSA guiding template assignment with redundant/dummy via insertion. ASP-DAC 2019: 305-310 - [c71]Hao Geng, Haoyu Yang, Yuzhe Ma, Joydeep Mitra, Bei Yu:
SRAF insertion via supervised dictionary learning. ASP-DAC 2019: 406-411 - [c70]Zheng Zhao, Derong Liu, Meng Li, Zhoufeng Ying, Lu Zhang, Biying Xu, Bei Yu, Ray T. Chen, David Z. Pan:
Hardware-software co-design of slimmed optical neural networks. ASP-DAC 2019: 705-710 - [c69]Yuzhe Ma, Haoxing Ren, Brucek Khailany, Harbinder Sikka, Lijuan Luo, Karthikeyan Natarajan, Bei Yu:
High Performance Graph Convolutional Networks with Applications in Testability Analysis. DAC 2019: 18 - [c68]Tinghuan Chen, Bingqing Lin, Hao Geng, Bei Yu:
Sensor Drift Calibration via Spatial Correlation Model in Smart Building. DAC 2019: 105 - [c67]Haocheng Li, Satwik Patnaik, Abhrajit Sengupta, Haoyu Yang, Johann Knechtel, Bei Yu, Evangeline F. Y. Young, Ozgur Sinanoglu:
Attacking Split Manufacturing from a Deep Learning Perspective. DAC 2019: 135 - [c66]Ran Chen, Wei Zhong, Haoyu Yang, Hao Geng, Xuan Zeng, Bei Yu:
Faster Region-based Hotspot Detection. DAC 2019: 146 - [c65]Yiyang Jiang, Fan Yang, Hengliang Zhu, Bei Yu, Dian Zhou, Xuan Zeng:
Efficient Layout Hotspot Detection via Binarized Residual Neural Network. DAC 2019: 147 - [c64]Haoyu Yang, Piyush Pathak, Frank Gennari, Ya-Chieh Lai, Bei Yu:
DeePattern: Layout Pattern Generation with Transforming Convolutional Auto-Encoder. DAC 2019: 148 - [c63]Bentian Jiang, Xiaopeng Zhang, Ran Chen, Gengjie Chen, Peishan Tu, Wei Li, Evangeline F. Y. Young, Bei Yu:
FIT: Fill Insertion Considering Timing. DAC 2019: 221 - [c62]Qi Sun, Tinghuan Chen, Jin Miao, Bei Yu:
Power-Driven DNN Dataflow Optimization on FPGA. ICCAD 2019: 1-7 - [c61]Yuzhe Ma, Ran Chen, Wei Li, Fanhua Shang, Wenjian Yu, Minsik Cho, Bei Yu:
A Unified Approximation Framework for Compressing and Accelerating Deep Neural Networks. ICTAI 2019: 376-383 - [i30]Kang Liu, Haoyu Yang, Yuzhe Ma, Benjamin Tan, Bei Yu, Evangeline F. Y. Young, Ramesh Karri, Siddharth Garg:
Are Adversarial Perturbations a Showstopper for ML-Based CAD? A Case Study on CNN-Based Lithographic Hotspot Detection. CoRR abs/1906.10773 (2019) - [i29]Haoyu Yang, Wen Chen, Piyush Pathak, Frank Gennari, Ya-Chieh Lai, Bei Yu:
Automatic Layout Generation with Applications in Machine Learning Engine Evaluation. CoRR abs/1912.05796 (2019) - [i28]Yuzhe Ma, Ziyang Yu, Bei Yu:
CAD Tool Design Space Exploration via Bayesian Optimization. CoRR abs/1912.06460 (2019) - [i27]Haoyu Yang, Wei Zhong, Yuzhe Ma, Hao Geng, Ran Chen, Wanli Chen, Bei Yu:
VLSI Mask Optimization: From Shallow To Deep Learning. CoRR abs/1912.07254 (2019) - 2018
- [j27]Xiaotao Jia, Yici Cai, Qiang Zhou, Bei Yu:
A Multicommodity Flow-Based Detailed Router With Efficient Acceleration Techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(1): 217-230 (2018) - [j26]Derong Liu, Bei Yu, Salim Chowdhury, David Z. Pan:
TILA-S: Timing-Driven Incremental Layer Assignment Avoiding Slew Violations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(1): 231-244 (2018) - [j25]Jin Miao, Meng Li, Subhendu Roy, Yuzhe Ma, Bei Yu:
SD-PUF: Spliced Digital Physical Unclonable Function. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 927-940 (2018) - [j24]Yibo Lin, Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Natarajan Viswanathan, Wen-Hao Liu, Zhuo Li, Charles J. Alpert, David Z. Pan:
MrDP: Multiple-Row Detailed Placement of Heterogeneous-Sized Cells for Advanced Nodes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(6): 1237-1250 (2018) - [j23]Yibo Lin, Bei Yu, Meng Li, David Z. Pan:
Layout Synthesis for Topological Quantum Circuits With 1-D and 2-D Architectures. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(8): 1574-1587 (2018) - [j22]Gengjie Chen, Chak-Wa Pui, Wing-Kai Chow, Ka-Chun Lam, Jian Kuang, Evangeline F. Y. Young, Bei Yu:
RippleFPGA: Routability-Driven Simultaneous Packing and Placement for Modern FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2022-2035 (2018) - [j21]Jian Kuang, Evangeline F. Y. Young, Bei Yu:
CRMA: Incorporating Cut Redistribution With Mask Assignment to Enable the Fabrication of 1-D Gridded Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2036-2049 (2018) - [j20]Shiyan Hu, Bei Yu, Huafeng Yu:
IEEE Transactions on Sustainable Computing: Guest Editorial on Special Issue on Sustainable Cyber-Physical Systems. IEEE Trans. Sustain. Comput. 3(2): 58-59 (2018) - [j19]Xingquan Li, Bei Yu, Jiaojiao Ou, Jianli Chen, David Z. Pan, Wenxing Zhu:
Graph-Based Redundant Via Insertion and Guiding Template Assignment for DSA-MP. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2504-2517 (2018) - [c60]Meng Li, Bei Yu, Yibo Lin, Xiaoqing Xu, Wuxi Li, David Z. Pan:
A practical split manufacturing framework for Trojan prevention via simultaneous wire lifting and cell insertion. ASP-DAC 2018: 265-270 - [c59]Haoyu Yang, Shuhe Li, Yuzhe Ma, Bei Yu, Evangeline F. Y. Young:
GAN-OPC: mask optimization with lithography-guided generative adversarial nets. DAC 2018: 131:1-131:6 - [c58]Haocheng Li, Wing-Kai Chow, Gengjie Chen, Evangeline F. Y. Young, Bei Yu:
Routability-driven and fence-aware legalization for mixed-cell-height circuits. DAC 2018: 150:1-150:6 - [c57]Grace Li Zhang, Bing Li, Bei Yu, David Z. Pan, Ulf Schlichtmann:
TimingCamouflage: Improving circuit security against counterfeiting by unconventional timing. DATE 2018: 91-96 - [c56]Qi Xu, Song Chen, Bei Yu, Feng Wu:
Memristive Crossbar Mapping for Neuromorphic Computing Systems on 3D IC. ACM Great Lakes Symposium on VLSI 2018: 451-454 - [c55]Fengxian Jiao, Sheqin Dong, Bei Yu, Bing Li, Ulf Schlichtmann:
Thermal-Aware Placement and Routing for 3D Optical Networks-on-Chips. ISCAS 2018: 1-4 - [c54]Wei Ye, Meng Li, Kai Zhong, Bei Yu, David Z. Pan:
Power Grid Reduction by Sparse Convex Optimization. ISPD 2018: 60-67 - [c53]Hao Geng, Haoyu Yang, Bei Yu, Xingquan Li, Xuan Zeng:
Sparse VLSI Layout Feature Extraction: A Dictionary Learning Approach. ISVLSI 2018: 488-493 - [i26]Song Chen, Qi Xu, Bei Yu:
Adaptive 3D-IC TSV Fault Tolerance Structure Generation. CoRR abs/1803.02490 (2018) - [i25]Haoyu Yang, Shuhe Li, Cyrus Tabery, Bingqing Lin, Bei Yu:
Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning. CoRR abs/1807.06446 (2018) - [i24]Yuzhe Ma, Subhendu Roy, Jin Miao, Jiamin Chen, Bei Yu:
Cross-layer Optimization for High Speed Adders: A Pareto Driven Machine Learning Approach. CoRR abs/1807.07023 (2018) - [i23]Qianru Zhang, Meng Zhang, Tinghuan Chen, Zhifei Sun, Yuzhe Ma, Bei Yu:
Recent Advances in Convolutional Neural Network Acceleration. CoRR abs/1807.08596 (2018) - [i22]Yuzhe Ma, Ran Chen, Wei Li, Fanhua Shang, Wenjian Yu, Minsik Cho, Bei Yu:
A Unified Approximation Framework for Deep Neural Networks. CoRR abs/1807.10119 (2018) - [i21]Xiaowei Xu, Xinyi Zhang, Bei Yu, Xiaobo Sharon Hu, Christopher Rowen, Jingtong Hu, Yiyu Shi:
DAC-SDC Low Power Object Detection Challenge for UAV Applications. CoRR abs/1809.00110 (2018) - [i20]Qi Sun, Yibo Lin, Iris Hui-Ru Jiang, Bei Yu, David Z. Pan:
OpenMPL: An Open Source Layout Decomposer. CoRR abs/1809.07554 (2018) - [i19]Husheng Zhou, Wei Li, Yuankun Zhu, Yuqun Zhang, Bei Yu, Lingming Zhang, Cong Liu:
DeepBillboard: Systematic Physical-World Testing of Autonomous Driving Systems. CoRR abs/1812.10812 (2018) - 2017
- [j18]Bingqing Lin, Bei Yu:
Smart building uncertainty analysis via adaptive Lasso. IET Cyper-Phys. Syst.: Theory & Appl. 2(1): 42-48 (2017) - [j17]Yibo Lin, Bei Yu, Yi Zou, Zhuo Li, Charles J. Alpert, David Z. Pan:
Stitch aware detailed placement for multiple E-beam lithography. Integr. 58: 47-54 (2017) - [j16]Meikang Qiu, Saurabh Kumar Garg, Rajkumar Buyya, Bei Yu, Shiyan Hu:
Special Issue on Scalable Cyber-Physical Systems. J. Parallel Distributed Comput. 103: 1-2 (2017) - [j15]Vinicius S. Livramento, Derong Liu, Salim Chowdhury, Bei Yu, Xiaoqing Xu, David Z. Pan, José Luís Almada Güntzel, Luiz C. V. dos Santos:
Incremental Layer Assignment Driven by an External Signoff Timing Engine. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(7): 1126-1139 (2017) - [j14]Yibo Lin, Bei Yu, Biying Xu, David Z. Pan:
Triple Patterning Aware Detailed Placement Toward Zero Cross-Row Middle-of-Line Conflict. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(7): 1140-1152 (2017) - [j13]Qi Xu, Song Chen, Xiaodong Xu, Bei Yu:
Clustered Fault Tolerance TSV Planning for 3-D Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(8): 1287-1300 (2017) - [j12]Yibo Lin, Bei Yu, David Z. Pan:
High Performance Dummy Fill Insertion With Coupling and Uniformity Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(9): 1532-1544 (2017) - [j11]Derong Liu, Bei Yu, Salim Chowdhury, David Z. Pan:
Incremental Layer Assignment for Timing Optimization. ACM Trans. Design Autom. Electr. Syst. 22(4): 75:1-75:25 (2017) - [c52]Haoyu Yang, Jing Su, Yi Zou, Bei Yu, Evangeline F. Y. Young:
Layout Hotspot Detection with Feature Tensor Generation and Deep Biased Learning. DAC 2017: 62:1-62:6 - [c51]Gengjie Chen, Jian Kuang, Zhiliang Zeng, Hang Zhang, Evangeline F. Y. Young, Bei Yu:
Minimizing Thermal Gradient and Pumping Power in 3D IC Liquid Cooling Network Design. DAC 2017: 70:1-70:6 - [c50]Soumi Chattopadhyay, Ansuman Banerjee, Bei Yu:
A utility-driven data transmission optimization strategy in large scale cyber-physical systems. DATE 2017: 1619-1622 - [c49]Yuzhe Ma, Jhih-Rong Gao, Jian Kuang, Jin Miao, Bei Yu:
A unified framework for simultaneous layout decomposition and mask optimization. ICCAD 2017: 81-88 - [c48]Chak-Wa Pui, Gengjie Chen, Yuzhe Ma, Evangeline F. Y. Young, Bei Yu:
Clock-aware ultrascale FPGA placement with machine learning routability prediction: (Invited paper). ICCAD 2017: 929-936 - [c47]Subhendu Roy, Yuzhe Ma, Jin Miao, Bei Yu:
A learning bridge from architectural synthesis to physical design for exploring power efficient high-performance adders. ISLPED 2017: 1-6 - [c46]Hang Zhang, Fengyuan Zhu, Haocheng Li, Evangeline F. Y. Young, Bei Yu:
Bilinear Lithography Hotspot Detection. ISPD 2017: 7-14 - [c45]Jiaojiao Ou, Bei Yu, Xiaoqing Xu, Joydeep Mitra, Yibo Lin, David Z. Pan:
DSAR: DSA aware Routing with Simultaneous DSA Guiding Pattern and Double Patterning Assignment. ISPD 2017: 91-98 - [c44]Cheng Zhuo, Bei Yu, Di Gao:
Accelerating chip design with machine learning: From pre-silicon to post-silicon. SoCC 2017: 227-232 - [c43]Haoyu Yang, Yajun Lin, Bei Yu, Evangeline F. Y. Young:
Lithography hotspot detection: From shallow to deep learning. SoCC 2017: 233-238 - [c42]Yuzhe Ma, Xuan Zeng, Bei Yu:
Methodologies for layout decomposition and mask optimization: A systematic review. VLSI-SoC 2017: 1-6 - 2016
- [j10]Bei Yu, Xiaoqing Xu, Subhendu Roy, Yibo Lin, Jiaojiao Ou, David Z. Pan:
Design for manufacturability and reliability in extreme-scaling VLSI. Sci. China Inf. Sci. 59(6): 061406:1-061406:23 (2016) - [j9]Xiaoqing Xu, Bei Yu, Jhih-Rong Gao, Che-Lun Hsu, David Z. Pan:
PARR: Pin-Access Planning and Regular Routing for Self-Aligned Double Patterning. ACM Trans. Design Autom. Electr. Syst. 21(3): 42:1-42:21 (2016) - [j8]Bei Yu, Kun Yuan, Jhih-Rong Gao, Shiyan Hu, David Z. Pan:
EBL Overlapping Aware Stencil Planning for MCC System. ACM Trans. Design Autom. Electr. Syst. 21(3): 43:1-43:24 (2016) - [c41]Hang Zhang, Haoyu Yang, Bei Yu, Evangeline F. Y. Young:
VLSI layout hotspot detection based on discriminative feature extraction. APCCAS 2016: 542-545 - [c40]Yibo Lin, Bei Yu, Yi Zou, Zhuo Li, Charles J. Alpert, David Z. Pan:
Stitch aware detailed placement for multiple e-beam lithography. ASP-DAC 2016: 186-191 - [c39]Tetsuaki Matsunawa, Bei Yu, David Z. Pan:
Laplacian eigenmaps and bayesian clustering based layout pattern sampling and its applications to hotspot detection and OPC. ASP-DAC 2016: 679-684 - [c38]Derong Liu, Bei Yu, Salim Chowdhury, David Z. Pan:
Incremental layer assignment for critical path timing. DAC 2016: 85:1-85:6 - [c37]Xiaotao Jia, Yici Cai, Qiang Zhou, Bei Yu:
MCFRoute 2.0: A Redundant Via Insertion Enhanced Concurrent Detailed Router. ACM Great Lakes Symposium on VLSI 2016: 87-92 - [c36]Yibo Lin, Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Natarajan Viswanathan, Wen-Hao Liu, Zhuo Li, Charles J. Alpert, David Z. Pan:
MrDP: multiple-row detailed placement of heterogeneous-sized cells for advanced nodes. ICCAD 2016: 7 - [c35]Meng Li, Kaveh Shamsi, Travis Meade, Zheng Zhao, Bei Yu, Yier Jin, David Z. Pan:
Provably secure camouflaging strategy for IC protection. ICCAD 2016: 28 - [c34]Jin Miao, Meng Li, Subhendu Roy, Bei Yu:
LRR-DPUF: learning resilient and reliable digital physical unclonable function. ICCAD 2016: 46 - [c33]Hang Zhang, Bei Yu, Evangeline F. Y. Young:
Enabling online learning in lithography hotspot detection with information-theoretic feature optimization. ICCAD 2016: 47 - [c32]Jian Kuang, Evangeline F. Y. Young, Bei Yu:
Incorporating cut redistribution with mask assignment to enable 1D gridded design. ICCAD 2016: 48 - [c31]Chak-Wa Pui, Gengjie Chen, Wing-Kai Chow, Ka-Chun Lam, Jian Kuang, Peishan Tu, Hang Zhang, Evangeline F. Y. Young, Bei Yu:
RippleFPGA: a routability-driven placement for large-scale heterogeneous FPGAs. ICCAD 2016: 67 - [c30]Jiaojiao Ou, Bei Yu, David Z. Pan:
Concurrent Guiding Template Assignment and Redundant via Insertion for DSA-MP Hybrid Lithography. ISPD 2016: 39-46 - [r1]Bei Yu, David Z. Pan:
Layout Decomposition for Triple Patterning. Encyclopedia of Algorithms 2016: 1062-1065 - 2015
- [j7]Bei Yu, Kun Yuan, Duo Ding, David Z. Pan:
Layout Decomposition for Triple Patterning Lithography. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(3): 433-446 (2015) - [j6]Xiaoqing Xu, Brian Cline, Greg Yeric, Bei Yu, David Z. Pan:
Self-Aligned Double Patterning Aware Pin Access and Standard Cell Layout Co-Optimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(5): 699-712 (2015) - [j5]Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Yibo Lin, Zhuo Li, Charles J. Alpert, David Z. Pan:
Methodology for Standard Cell Compliance and Detailed Placement for Triple Patterning Lithography. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(5): 726-739 (2015) - [c29]Bei Yu, David Z. Pan, Tetsuaki Matsunawa, Xuan Zeng:
Machine learning and pattern matching in physical design. ASP-DAC 2015: 286-293 - [c28]Jiwoo Pak, Bei Yu, David Z. Pan:
Electromigration-aware redundant via insertion. ASP-DAC 2015: 544-549 - [c27]Xiaoqing Xu, Bei Yu, Jhih-Rong Gao, Che-Lun Hsu, David Z. Pan:
PARR: pin access planning and regular routing for self-aligned double patterning. DAC 2015: 28:1-28:6 - [c26]