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"Test access mechaism for stack test time reduction of 3-dimensional ..."

Inhyuk Choi, Hyunggoy Oh, Sungho Kang (2016)

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DOI: 10.1109/APCCAS.2016.7804019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525

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