"Invited talk I: The foundations of robustness in reconfigurability in a ..."

Gary Swift (2017)

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DOI: 10.1109/AHS.2017.8046350

access: closed

type: Conference or Workshop Paper

metadata version: 2017-09-27

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Gary Swift:
Invited talk I: The foundations of robustness in reconfigurability in a radiation environment: Understanding single-event effects test results on SRAM-based FPGAs. AHS 2017: xv

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