"A built-in supply current test circuit for electrical interconnect tests ..."

Masaki Hashizume et al. (2014)

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DOI: 10.1109/3DIC.2014.7152148

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Masaki Hashizume, Shoichi Umezu, Hiroyuki Yotsuyanagi, Shyue-Kung Lu:
A built-in supply current test circuit for electrical interconnect tests of 3D ICs. 3DIC 2014: 1-6

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