BibTeX record journals/tr/0022L002

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@article{DBLP:journals/tr/0022L002,
  author       = {Gang Chen and
                  Ming Fu Li and
                  Ying Jin},
  title        = {Interaction of interface-traps located at various sites in MOSFETs
                  under stress},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {51},
  number       = {4},
  pages        = {387--391},
  year         = {2002},
  url          = {https://doi.org/10.1109/TR.2002.804485},
  doi          = {10.1109/TR.2002.804485},
  timestamp    = {Thu, 09 Jul 2020 22:46:37 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/0022L002.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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