Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Interaction of interface-traps located at various sites in MOSFETs under ..."

Gang Chen, Ming Fu Li, Ying Jin (2002)

> Home

Details and statistics

DOI: 10.1109/TR.2002.804485

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/0022L002
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/0022L002
Gang Chen, Ming Fu Li, Ying Jin:
Interaction of interface-traps located at various sites in MOSFETs under stress. IEEE Trans. Reliab. 51(4): 387-391 (2002)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.