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BibTeX record journals/mr/TsengLHLCCL10
@article{DBLP:journals/mr/TsengLHLCCL10, author = {H. W. Tseng and C. T. Lu and Y. H. Hsiao and P. L. Liao and Y. C. Chuang and T. Y. Chung and Cheng{-}Yi Liu}, title = {Electromigration-induced failures at Cu/Sn/Cu flip-chip joint interfaces}, journal = {Microelectron. Reliab.}, volume = {50}, number = {8}, pages = {1159--1162}, year = {2010}, url = {https://doi.org/10.1016/j.microrel.2010.05.002}, doi = {10.1016/J.MICROREL.2010.05.002}, timestamp = {Fri, 20 Oct 2023 17:04:45 +0200}, biburl = {https://dblp.org/rec/journals/mr/TsengLHLCCL10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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