BibTeX record journals/mr/LauYEHLSVC08

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@article{DBLP:journals/mr/LauYEHLSVC08,
  author       = {W. S. Lau and
                  Peizhen Yang and
                  C. W. Eng and
                  V. Ho and
                  C. H. Loh and
                  S. Y. Siah and
                  D. Vigar and
                  L. Chan},
  title        = {A study of the linearity between I\({}_{\mbox{on}}\) and log I\({}_{\mbox{off}}\)
                  of modern {MOS} transistors and its application to stress engineering},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {4},
  pages        = {497--503},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2007.10.002},
  doi          = {10.1016/J.MICROREL.2007.10.002},
  timestamp    = {Sat, 22 Feb 2020 19:28:08 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LauYEHLSVC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}