BibTeX record journals/corr/abs-2111-01369

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@article{DBLP:journals/corr/abs-2111-01369,
  author       = {Michihiro Shintani and
                  Riaz{-}ul{-}haque Mian and
                  Tomoki Nakamura and
                  Masuo Kajiyama and
                  Makoto Eiki and
                  Michiko Inoue},
  title        = {Wafer-level Variation Modeling for Multi-site {RF} {IC} Testing via
                  Hierarchical Gaussian Process},
  journal      = {CoRR},
  volume       = {abs/2111.01369},
  year         = {2021},
  url          = {https://arxiv.org/abs/2111.01369},
  eprinttype    = {arXiv},
  eprint       = {2111.01369},
  timestamp    = {Mon, 08 Nov 2021 08:27:26 +0100},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2111-01369.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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