"Wafer-level Variation Modeling for Multi-site RF IC Testing via ..."

Michihiro Shintani et al. (2021)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-11-08

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  - journals/corr/abs-2111-01369
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  - https://dblp.org/rec/journals/corr/abs-2111-01369
Michihiro Shintani, Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue:
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. CoRR abs/2111.01369 (2021)

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