BibTeX record conf/isocc/OhKLK18

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@inproceedings{DBLP:conf/isocc/OhKLK18,
  author       = {Hyunggoy Oh and
                  Heetae Kim and
                  Sangjun Lee and
                  Sungho Kang},
  title        = {Dynamic voltage Drop induced Path Delay Analysis for {STV} and {NTV}
                  Circuits during At-speed Scan Test},
  booktitle    = {International SoC Design Conference, {ISOCC} 2018, Daegu, South Korea,
                  November 12-15, 2018},
  pages        = {7--8},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ISOCC.2018.8649911},
  doi          = {10.1109/ISOCC.2018.8649911},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/conf/isocc/OhKLK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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