BibTeX record conf/irps/RuzzarinBZMMJLC19

• > Home > conf/irps/RuzzarinBZMMJLC19

@inproceedings{DBLP:conf/irps/RuzzarinBZMMJLC19,
  author       = {Maria Ruzzarin and
                  Matteo Borga and
                  Enrico Zanoni and
                  Matteo Meneghini and
                  Gaudenzio Meneghesso and
                  Dong Ji and
                  Wenwen Li and
                  Silvia H. Chan and
                  Anchal Agarwal and
                  Chirag Gupta and
                  Stacia Keller and
                  Umesh K. Mishra and
                  Srabanti Chowdhury},
  title        = {Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based
                  Vertical Trench MOSFETs (OG-FETs)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720589},
  doi          = {10.1109/IRPS.2019.8720589},
  timestamp    = {Tue, 07 May 2024 20:11:34 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/RuzzarinBZMMJLC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}