BibTeX record conf/essderc/ParkWNKLRKLHCY17

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@inproceedings{DBLP:conf/essderc/ParkWNKLRKLHCY17,
  author       = {Sung{-}Kun Park and
                  Donghyun Woo and
                  Min{-}Ki Na and
                  Pyong{-}Su Kwag and
                  Ho{-}Ryeong Lee and
                  Kyoung{-}Wook Ro and
                  Kyung{-}Hwan Kim and
                  Dong{-}Kyu Lee and
                  Chris Hong and
                  In{-}Wook Cho and
                  Kyung{-}Dong Yoo},
  title        = {Epitaxial growth and diffusion characteristics analysis of vertical
                  thin poly-Si channel transfer gate structured pixels for 3D {CMOS}
                  image sensor},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {220--223},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066631},
  doi          = {10.1109/ESSDERC.2017.8066631},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/ParkWNKLRKLHCY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}