BibTeX record conf/eit/WuCLR08

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@inproceedings{DBLP:conf/eit/WuCLR08,
  author       = {Po{-}Han Wu and
                  Tsung{-}Tang Chen and
                  Wei{-}Lin Li and
                  Jiann{-}Chyi Rau},
  title        = {An efficient test-data compaction for low power {VLSI} testing},
  booktitle    = {2008 {IEEE} International Conference on Electro/Information Technology,
                  {EIT} 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20,
                  2008},
  pages        = {237--241},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/EIT.2008.4554304},
  doi          = {10.1109/EIT.2008.4554304},
  timestamp    = {Wed, 24 May 2017 08:28:43 +0200},
  biburl       = {https://dblp.org/rec/conf/eit/WuCLR08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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