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"An efficient test-data compaction for low power VLSI testing."

Po-Han Wu et al. (2008)

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DOI: 10.1109/EIT.2008.4554304

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau:
An efficient test-data compaction for low power VLSI testing. EIT 2008: 237-241

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