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Eric Bruls

E. M. J. G. Bruls

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Journal Articles

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1996
[j1]
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  - https://dblp.org/rec/journals/et/Rodriguez-MontanesBF96
Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras:
Bridging defects resistance in the metal layer of a CMOS process. J. Electron. Test. 8(1): 35-46 (1996)

Conference and Workshop Papers

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1997
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R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien:
Built-in self-test methodology for A/D converters. ED&TC 1997: 353-358
1996
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Marly Roncken, Eric Bruls:
Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. ITC 1996: 205-214
1994
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Eric Bruls:
Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. ITC 1994: 562-571
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R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker:
Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649
1993
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  - conf/itc/RosmalenBBJ93
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M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess:
Parameter Monitoring: Advantages and Pitfalls. ITC 1993: 115-124
1992
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Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls:
Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899
1991
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Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess:
A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227

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