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F. Camerik

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1990 – 1999

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1991
[c2]
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  dblp key:
  - conf/itc/BrulsCKJ91
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  persistent URL:
  - https://dblp.org/rec/conf/itc/BrulsCKJ91
Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess:
A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227

1980 – 1989

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1989
[c1]
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  - conf/itc/CamerikDJ89
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F. Camerik, P. A. J. Dirks, Jochen A. G. Jess:
Qualification and Quantification of Process-Induced Product-Related Defects. ITC 1989: 643-652

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