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Journal Articles
- 2010
[j1]Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki:
Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression. IEICE Trans. Inf. Syst. 93-D(1): 17-23 (2010)
Conference and Workshop Papers
- 2022
- [c10]Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran:
PPA Optimization of Test Points in Automotive Designs. ITC 2022: 204-212 - 2019
- [c9]Christos Papameletis, Vivek Chickermane, Brian Foutz, Sarthak Singhal, Krishna Chakravadhanula:
Optimized Physical DFT Synthesis of Unified Compression and LBIST for Automotive Applications. ITC 2019: 1-6 - 2017
- [c8]Krishna Chakravadhanula, Vivek Chickermane, Paul Cunningham, Brian Foutz, Dale Meehl, Louis Milano, Christos Papameletis, David Scott, Steev Wilcox:
Advancing test compression to the physical dimension. ITC 2017: 1-10 - 2014
- [c7]Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, Akhil Garg, Richard Schoonover, James Sage, Don Pearl, Thomas J. Snethen:
Efficient testing of hierarchical core-based SOCs. ITC 2014: 1-10 - 2010
- [c6]Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise:
Low cost at-speed testing using On-Product Clock Generation compatible with test compression. ITC 2010: 724-733 - 2008
- [c5]Brion L. Keller, Sandeep Bhatia, Thomas Bartenstein, Brian Foutz, Anis Uzzaman:
Optimizing Test Data Volume Using Hybrid Compression. ATS 2008: 157-162 - 2007
- [c4]Krishna Chakravadhanula, Nitin Parimi, Brian Foutz, Bing Li, Vivek Chickermane:
Low Power Reduced Pin Count Test Methodology. ATS 2007: 251-258 - 2006
- [c3]Brian Foutz, Vivek Chickermane, Bing Li, Harry Linzer, Gary Kunselman:
Automation of IEEE 1149.6 Boundary Scan Synthesis in an ASIC Methodology. ATS 2006: 381-388 - 2004
- [c2]Vivek Chickermane, Brian Foutz, Brion L. Keller:
Channel Masking Synthesis for Efficient On-Chip Test Compression. ITC 2004: 452-461 - 2002
- [c1]Martin Foltin, Brian Foutz, Sean Tyler:
Efficient stimulus independent timing abstraction model based on a new concept of circuit block transparency. DAC 2002: 158-163
Coauthor Index
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