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"Advancing test compression to the physical dimension."

Krishna Chakravadhanula et al. (2017)

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DOI: 10.1109/TEST.2017.8242035

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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  - conf/itc/Chakravadhanula17
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  - https://dblp.org/rec/conf/itc/Chakravadhanula17
Krishna Chakravadhanula, Vivek Chickermane, Paul Cunningham, Brian Foutz, Dale Meehl, Louis Milano, Christos Papameletis, David Scott, Steev Wilcox:
Advancing test compression to the physical dimension. ITC 2017: 1-10

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