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ORCIDStephen W. Director
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2000 – 2009
- 2005
[c31]Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Stephen W. Director:
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540- 2001
- [c30]Juan Antonio Carballo, Stephen W. Director:
Application of Constraint-Based Heuristics in Collaborative Design. DAC 2001: 395-400 - 2000
- [c29]Jingyan Zuo, Stephen W. Director:
An Integrated Design Environment for Early Stage Conceptual Design. DATE 2000: 754
1990 – 1999
- 1999
- [c28]Juan Antonio Carballo, Stephen W. Director:
Constraint Management for Collaborative Electronic Design. DAC 1999: 529-534 - 1998
- [j24]Stephen W. Director:
Electrical Engineering Education Update. Proc. IEEE 86(2): 460-462 (1998) - [c27]Peter R. Sutton, Stephen W. Director:
Framework Encapsulations: A New Approach to CAD Tool Interoperability. DAC 1998: 134-139 - 1996
- [j23]Margarida F. Jacome, Stephen W. Director:
A formal basis for design process planning and management. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(10): 1197-1210 (1996) - [c26]Peter R. Sutton, Stephen W. Director:
A Description Language for Design Process Management. DAC 1996: 175-180 - [c25]John W. Hagerman, Stephen W. Director:
Improved Tool and Data Selection in Task Management. DAC 1996: 181-184 - [c24]Vladimir A. Shepelev, Stephen W. Director:
Automatic workflow generation. EURO-DAC 1996: 104-109 - 1995
- [j22]Stephen W. Director, Pradeep K. Khosla, Ronald A. Rohrer, Rob A. Rutenbar
:
Reengineering the curriculum: design and analysis of a new undergraduate Electrical and Computer Engineering degree at Carnegie Mellon University. Proc. IEEE 83(9): 1246-1269 (1995) - [j21]Jay B. Brockman, Stephen W. Director:
The schema-based approach to workflow management. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(10): 1257-1267 (1995) - [j20]Kannan Krishna, Stephen W. Director:
The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(12): 1557-1568 (1995) - [c23]Kannan Krishna, Stephen W. Director:
A novel methodology for statistical parameter extraction. ICCAD 1995: 696-699 - 1994
- [c22]Zhihua Wang, Stephen W. Director:
A novel approximation procedure for efficient yield simulation and optimization of integrated circuits. Annual Simulation Symposium 1994: 166-173 - [c21]Vladimir A. Koval, Igor W. Farmaga, Andrzej J. Strojwas, Stephen W. Director:
MONSTR: A Complete Thermal Simulator of Electronic Systems. DAC 1994: 570-575 - [c20]Zhihua Wang, Stephen W. Director:
An Efficient Yield Optimization Method Using A Two Step Linear Approximation of Circuit Performance. EDAC-ETC-EUROASIC 1994: 567-571 - [c19]Margarida F. Jacome, Stephen W. Director:
A formal basis for design process planning and management. ICCAD 1994: 516-521 - 1993
- [j19]Peter Feldmann, Stephen W. Director:
Integrated circuit quality optimization using surface integrals. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(12): 1868-1879 (1993) - [c18]Peter R. Sutton, Jay B. Brockman, Stephen W. Director:
Design Management Using Dynamically Defined Flows. DAC 1993: 648-653 - 1992
- [c17]Margarida F. Jacome, Stephen W. Director:
Design Process Management for CAD Frameworks. DAC 1992: 500-505 - [c16]Juan Carlos López, Margarida F. Jacome, Stephen W. Director:
Design assistance for CAD frameworks. EURO-DAC 1992: 494-499 - [c15]Stephen W. Director, Jonathan Allen, J. Duley:
Engineering education: trends and needs (panel). ICCAD 1992: 456 - [c14]Jay B. Brockman, Stephen W. Director:
A Schema-Based Approach to CAD Task Management. Electronic Design Automation Frameworks 1992: 71-84 - 1991
- [j18]Peter Feldmann, Tuyen V. Nguyen, Stephen W. Director, Ronald A. Rohrer:
Sensitivity computation in piecewise approximate circuit simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(2): 171-183 (1991) - [j17]James Daniell, Stephen W. Director:
An object oriented approach to CAD tool control [VLSI]. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(6): 698-713 (1991) - [j16]K. K. Low, Stephen W. Director:
A new methodology for the design centering of IC fabrication processes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(7): 895-903 (1991) - [j15]Andrzej J. Strojwas, Stephen W. Director:
An efficient algorithm for parametric fault simulation of monolithic IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(8): 1049-1058 (1991) - [c13]Peter Feldmann, Stephen W. Director:
Improved Methods for IC Yield and Quality Optimization Using Surface Integrals. ICCAD 1991: 158-161 - [c12]Jay B. Brockman, Stephen W. Director:
The Hercules CAD Task Management System. ICCAD 1991: 254-257 - 1990
- [c11]Peter Feldmann, Stephen W. Director:
Accurate and Efficient Evaluation of Circuit Yield and Yield Gradients. ICCAD 1990: 120-123
1980 – 1989
- 1989
- [j14]Michael L. Bushnell, Stephen W. Director:
Automated design tool execution in the Ulysses design environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(3): 279-287 (1989) - [j13]K. K. Low, Stephen W. Director:
An efficient methodology for building macromodels of IC fabrication processes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(12): 1299-1313 (1989) - [c10]M. T. Trick, Stephen W. Director:
LASSIE: Structure to Layout for Behavioral Synthesis Tools. DAC 1989: 104-109 - [c9]James Daniell, Stephen W. Director:
An Object Oriented Approach to CAD Tool Control within a Design Framework. DAC 1989: 197-202 - [c8]K. K. Low, Stephen W. Director:
A new methodology for the design centering of IC fabrication processes. ICCAD 1989: 194-197 - [c7]Tuyen V. Nguyen, Peter Feldmann, Stephen W. Director, Ronald A. Rohrer:
SPECS simulation validation with efficient transient sensitivity computation. ICCAD 1989: 252-255 - [c6]Allen M. Dewey, Stephen W. Director:
Yoda: a framework for the conceptual design VLSI systems. ICCAD 1989: 380-383 - 1988
- [j12]Andrzej J. Strojwas, Stephen W. Director:
The process engineer's workbench. IEEE J. Solid State Circuits 23(2): 377-386 (1988) - [c5]K. K. Low, Stephen W. Director:
An efficient macromodeling approach for statistical IC process design. ICCAD 1988: 16-19 - [c4]Jay B. Brockman, Stephen W. Director:
Predictive subset testing for IC performance. ICCAD 1988: 336-339 - 1987
- [j11]Michael L. Bushnell, Stephen W. Director:
ULYSSES - a knowledge-based VLSI design environment. Artif. Intell. Eng. 2(1): 33-41 (1987) - 1986
- [j10]Costas J. Spanos, Stephen W. Director:
Parameter Extraction for Statistical IC Process Characterization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 66-78 (1986) - [j9]Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director:
A Methodology for Worst-Case Analysis of Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 104-113 (1986) - [j8]Wojciech Maly, Andrzej J. Strojwas, Stephen W. Director:
VLSI Yield Prediction and Estimation: A Unified Framework. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 114-130 (1986) - [j7]David P. La Potin, Stephen W. Director:
Mason: A Global Floorplanning Approach for VLSI Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(4): 477-489 (1986) - [j6]D. M. H. Walker, Stephen W. Director:
VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(4): 541-556 (1986) - [c3]Michael L. Bushnell, Stephen W. Director:
VLSI CAD tool integration using the Ulysses environment. DAC 1986: 55-61 - [c2]Luís M. Vidigal, Sani R. Nassif, Stephen W. Director:
CINNAMON: coupled integration and nodal analysis of MOS networks. DAC 1986: 179-185 - 1985
- [j5]Tariq Samad, Stephen W. Director:
Natural-Language Interface for CAD: A First Step. IEEE Des. Test 2(4): 78-86 (1985) - [j4]Andrzej J. Strojwas, Stephen W. Director:
A Pattern Recognition Based Method for IC Failure Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 4(1): 76-92 (1985) - [j3]Karem A. Sakallah, Stephen W. Director:
SAMSON2: An Event Driven VLSI Circuit Simulator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 4(4): 668-684 (1985) - [c1]Tariq Samad, Stephen W. Director:
Towards a natural language interface for CAD. DAC 1985: 2-8 - 1984
- [j2]Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director:
FABRICS II: A Statistically Based IC Fabrication Process Simulator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3(1): 40-46 (1984) - 1982
- [j1]Luís M. Vidigal, Stephen W. Director:
A Design Centering Algorithm for Nonconvex Regions of Acceptability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1(1): 13-24 (1982)
Coauthor Index
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