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Wei-pin Changchien

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Journal Articles

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2015
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  - journals/tvlsi/YeHHCGLT0CLCEKL15
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  - https://dblp.org/rec/journals/tvlsi/YeHHCGLT0CLCEKL15
Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan:
Diagnosis and Layout Aware (DLA) Scan Chain Stitching. IEEE Trans. Very Large Scale Integr. Syst. 23(3): 466-479 (2015)

Conference and Workshop Papers

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2013
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Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan:
Diagnosis and Layout Aware (DLA) scan chain stitching. ITC 2013: 1-10
2011
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Po-Juei Chen, Wei-Li Hsu, James Chien-Mo Li, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Charles C. C. Liu:
An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. Asian Test Symposium 2011: 291-296

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