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Journal Articles

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2011
[j3]
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  dblp key:
  - journals/mr/PietranicoLPBB11
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  - https://dblp.org/rec/journals/mr/PietranicoLPBB11
S. Pietranico, Stéphane Lefebvre, S. Pommier, M. Berkani Bouaroudj, S. Bontemps:
A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices. Microelectron. Reliab. 51(9-11): 1824-1829 (2011)
2009
[j2]
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S. Pietranico, S. Pommier, Stéphane Lefebvre, Zoubir Khatir, S. Bontemps:
Characterisation of power modules ceramic substrates for reliability aspects. Microelectron. Reliab. 49(9-11): 1260-1266 (2009)
2006
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  - journals/mr/DupontKLB06
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Laurent Dupont, Zoubir Khatir, Stéphane Lefebvre, S. Bontemps:
Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling. Microelectron. Reliab. 46(9-11): 1766-1771 (2006)

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