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ORCIDGordon Russell 0002
Person information
- affiliation: Newcastle University, School of Electrical, Electronic and Computer Engineering, Newcastle upon Tyne, United Kingdom
Other persons with the same name
- Gordon Russell 0001
![[0000-0002-3589-3051]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0002-3589-3051")
— Edinburgh Napier University, United Kingdom
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2010 – 2019
- 2012
[c15]Ahmed Naif M. Alahmadi, Gordon Russell, Alex Yakovlev:
Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier. DDECS 2012: 366-371- [c14]Gordon Russell, Frank P. Burns, Alex Yakovlev:
VARMA - VARiability modelling and analysis tool. DDECS 2012: 378-383 - [c13]Chenxi Ni, Gordon Russell, Alex Bystrov:
Statistical delay modelling of manufacturing process variations at system level. NEWCAS 2012: 133-136 - [c12]Chenxi Ni, Ziyad Al Tarawneh, Gordon Russell, Alexandre V. Bystrov:
Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level. PATMOS 2012: 11-20 - 2011
- [j9]Santosh Shedabale, Gordon Russell, Alexandre Yakovlev:
M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters. IET Circuits Devices Syst. 5(5): 403-410 (2011) - [j8]Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell, Alexandre Yakovlev:
Sub-threshold synchronizer. Microelectron. J. 42(6): 840-850 (2011) - [j7]Nor Muzlifah Mahyuddin, Gordon Russell, E. Graeme Chester:
Design and analysis of a low-swing driver scheme for long interconnects. Microelectron. J. 42(9): 1039-1048 (2011) - 2010
- [c11]Jun Zhou, Maryam Ashouei, David Kinniment, Jos Huisken, Gordon Russell:
Extending Synchronization from Super-Threshold to Sub-threshold Region. ASYNC 2010: 85-93
2000 – 2009
- 2008
- [j6]Santosh Shedabale, Hiran Ramakrishnan, Gordon Russell, Alexandre Yakovlev, Sanatan Chattopadhyay:
Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response. IET Circuits Devices Syst. 2(5): 451-464 (2008) - [j5]Jun Zhou, David Kinniment, Charles E. Dike, Gordon Russell, Alexandre Yakovlev:
On-Chip Measurement of Deep Metastability in Synchronizers. IEEE J. Solid State Circuits 43(2): 550-557 (2008) - [c10]Jun Zhou, David Kinniment, Gordon Russell, Alex Yakovlev:
Adapting Synchronizers to the Effects of on Chip Variability. ASYNC 2008: 39-47 - [c9]Nikolaos Minas, Matthew Marshall, Gordon Russell, Alex Yakovlev:
FPGA Implementation of an Asynchronous Processor with Both Online and Offline Testing Capabilities. ASYNC 2008: 128-137 - [c8]Nikolaos Minas, David Kinniment, Gordon Russell, Alex Yakovlev:
High resolution flash time-to-digital converter with sub-picosecond measurement capabilities. SoC 2008: 1-4 - [c7]Basel Halak, Santosh Shedabale, Hiran Ramakrishnan, Alexandre Yakovlev, Gordon Russell:
The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. SLIP 2008: 65-72 - 2007
- [j4]M. Amir Abas, Gordon Russell, David Kinniment:
Embedded high-resolution delay measurement system using time amplification. IET Comput. Digit. Tech. 1(2): 77-86 (2007) - [j3]M. Amir Abas, Gordon Russell, David Kinniment:
Built-in time measurement circuits - a comparative design study. IET Comput. Digit. Tech. 1(2): 87-97 (2007) - [j2]David Kinniment, Charles E. Dike, Keith Heron, Gordon Russell, Alexandre Yakovlev:
Measuring Deep Metastability and Its Effect on Synchronizer Performance. IEEE Trans. Very Large Scale Integr. Syst. 15(9): 1028-1039 (2007) - [c6]Nikolaos Minas, David Kinniment, Keith Heron, Gordon Russell:
A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability. ASYNC 2007: 163-174 - [c5]Matthew Marshall, Gordon Russell:
A Low Power Information Redundant Concurrent Error Detecting Asynchronous Processor. DSD 2007: 649-656 - 2006
- [c4]David Kinniment, Keith Heron, Gordon Russell:
Measuring Deep Metastability. ASYNC 2006: 2-11 - [c3]Jun Zhou, David Kinniment, Gordon Russell, Alexandre Yakovlev:
A Robust Synchronizer. ISVLSI 2006: 442-443 - 2004
- [c2]M. Amir Abas, Gordon Russell, D. J. Kinniment:
Design of Sub-10-Picoseconds On-Chip Time Measurement Circuit. DATE 2004: 804-809 - 2003
- [j1]D. J. Kinniment, Oleh V. Maevsky, Alexandre V. Bystrov, Gordon Russell, Alexandre Yakovlev:
On-chip structures for timing measurement and test. Microprocess. Microsystems 27(9): 473-483 (2003) - 2002
- [c1]D. J. Kinniment, Oleh V. Maevsky, Gordon Russell, Alexandre Yakovlev, Alexandre V. Bystrov:
On-Chip Structures for Timing Measurements and Test. ASYNC 2002: 190-197
Coauthor Index
aka: D. J. Kinniment
aka: Alex Yakovlev
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