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Arnost Neugroschel

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2000 – 2009

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2007
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Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker:
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47(4-5): 479-488 (2007)
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Arnost Neugroschel, Gennadi Bersuker, Rino Choi:
Applications of DCIV method to NBTI characterization. Microelectron. Reliab. 47(9-11): 1366-1372 (2007)

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