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Boubekeur Tala-Ighil

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2015
[j11]
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  - https://dblp.org/rec/journals/mr/Tala-IghilTGML15
Boubekeur Tala-Ighil, Jean-Lionel Trolet, Hamid Gualous, Philippe Mary, Stéphane Lefebvre:
Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. Microelectron. Reliab. 55(9-10): 1512-1516 (2015)
2013
[j10]
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  - journals/mr/OukaourPTGPGB13
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Amrane Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, Hamid Gualous, Eric Pigeon, Olivier Gehan, Bertrand Boudart:
Supercapacitors aging diagnosis using least square algorithm. Microelectron. Reliab. 53(9-11): 1638-1642 (2013)
2012
[j9]
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Hamid Gualous, Roland Gallay, Monzer Al Sakka, Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Boudart:
Calendar and cycling ageing of activated carbon supercapacitor for automotive application. Microelectron. Reliab. 52(9-10): 2477-2481 (2012)
2011
[j8]
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Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart:
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectron. Reliab. 51(2): 386-391 (2011)
[j7]
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Boubekeur Tala-Ighil, Amrane Oukaour, Hamid Gualous, Bertrand Boudart, Bertrand Pouderoux, Jean-Lionel Trolet, Marc Piccione:
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. Microelectron. Reliab. 51(9-11): 2010-2014 (2011)
2010
[j6]
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  - journals/mr/GualousGATOBM10
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Hamid Gualous, Roland Gallay, G. Alcicek, Boubekeur Tala-Ighil, Amrane Oukaour, Bertrand Boudart, Philippe Makany:
Supercapacitor ageing at constant temperature and constant voltage and thermal shock. Microelectron. Reliab. 50(9-11): 1783-1788 (2010)
[j5]
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  - journals/mr/TounsiOTGBA10
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M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani:
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectron. Reliab. 50(9-11): 1810-1814 (2010)
2005
[j4]
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  - journals/mr/MaigaTTB05
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Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart:
Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectron. Reliab. 45(9-11): 1728-1731 (2005)
2004
[j3]
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Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart:
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. Microelectron. Reliab. 44(9-11): 1461-1465 (2004)
2003
[j2]
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  - journals/mr/ToutahTLBMB03
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Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectron. Reliab. 43(9-11): 1531-1535 (2003)
2001
[j1]
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  - journals/mr/ToutahLTMHGB01
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Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud:
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. Microelectron. Reliab. 41(9-10): 1325-1329 (2001)

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