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"Characterization of high-voltage IGBT module degradations under PWM power ..."
M. Tounsi et al. (2010)
- M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani
:
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectron. Reliab. 50(9-11): 1810-1814 (2010)
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