"Characterization of high-voltage IGBT module degradations under PWM power ..."

M. Tounsi et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.059

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani:
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectron. Reliab. 50(9-11): 1810-1814 (2010)

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