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S. P. M. Noijen

Sander Noijen

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2010 – 2019

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2010
[j2]
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  - journals/mr/NoijenEMOSS10
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Sander Noijen, Roy Engelen, Joerg Martens, Alexandru Opran, Olaf van der Sluis, Richard B. R. van Silfhout:
Prediction of the epoxy moulding compound aging effect on package reliability. Microelectron. Reliab. 50(7): 917-922 (2010)

2000 – 2009

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2009
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S. P. M. Noijen, Olaf van der Sluis, P. H. M. Timmermans, G. Q. Zhang:
Numerical prediction of failure paths at a roughened metal/polymer interface. Microelectron. Reliab. 49(9-11): 1315-1318 (2009)

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