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Journal Articles
- 2018
[j6]Hajime Sasaki
, Takayuki Hisaka, Kaoru Kadoiwa, Tomoki Oku, Shinobu Onoda, Takeshi Ohshima, Eiji Taguchi, Hidehiro Yasuda:
Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. Microelectron. Reliab. 81: 312-319 (2018)- 2012
- [j5]Hajime Sasaki, Takayuki Hisaka, Kaoru Kadoiwa, Yoshikazu Terai, Yasufumi Fujiwara:
Characteristics of SiN/GaAs interface under exposure to high-temperature and high-humidity conditions measured by photoreflectance spectroscopy. IEICE Electron. Express 9(20): 1592-1597 (2012) - 2010
- [j4]Takayuki Hisaka, Hajime Sasaki, Takayuki Kato, Ko Kanaya, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo:
Simultaneous achievement of high performance and high reliability in a 38/77GHz InGaAs/AlGaAs PHEMT MMIC. IEICE Electron. Express 7(8): 558-562 (2010) - 2009
- [j3]Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi:
Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectron. Reliab. 49(12): 1515-1519 (2009) - 2005
- [j2]Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi:
Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectron. Reliab. 45(12): 1894-1900 (2005) - 1999
- [j1]Akira Ohta, Norio Higashisaka, Tetsuya Heima, Takayuki Hisaka, Hirofumi Nakano, Ryuji Ohmura, Tadashi Takagi, Noriyuki Tanino:
A 12-ps-resolution digital variable-delay macro cell on GaAs 100 K-gates gate array using a meshed air bridge structure. IEEE J. Solid State Circuits 34(1): 33-41 (1999)
Coauthor Index
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