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"Corrosion-induced degradation of GaAs PHEMTs under operation in high ..."

Takayuki Hisaka et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.046

access: closed

type: Journal Article

metadata version: 2020-02-22

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Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, Anita A. Villanueva, Jesús A. del Alamo, Shigehiko Hasegawa, Hajime Asahi:
Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions. Microelectron. Reliab. 49(12): 1515-1519 (2009)

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