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Sungyoung Yoon
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2020 – today
- 2021
- [c5]Jaehun Lee, Youngcheon Jeong, Kyongsik Yeom, Changmin Jeon, Jongsung Woo, Sangjin Lee, Ga-Young Lee, Dong-Hwee Hwang, Yong Seok Chung, Minji Seo, Dong-Hyun Kim, DalHwan Kim, Yongsik Kim, HyunChang Lee, Soomin Cho, MyeongHee Oh, Hyun-Jin Shin, Gun Rae Kim, Sungyoung Yoon, Yong Kyu Lee, Young Ki Hong:
Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. IMW 2021: 1-3 - 2020
- [c4]Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee:
Reliability of Industrial grade Embedded-STT-MRAM. IRPS 2020: 1-3
2010 – 2019
- 2018
- [c3]Hyun-Chul Sagong, Hyunjin Kim, Seungjin Choo, Sungyoung Yoon, Hyewon Shim, Sangsu Ha, Tae-Young Jeong, Minhyeok Choe, Junekyun Park, Sangchul Shin, Sangwoo Pae:
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology. IRPS 2018: 6
2000 – 2009
- 2009
- [c2]Sungyoung Yoon, Jonghoon Seo, Joonyoung Yoon, Seungchul Shin, Tack-Don Han:
A Usability Evaluation of Public Icon Interface. HCI (1) 2009: 540-546 - [c1]Seungchul Shin, Do-Yoon Kim, Sungyoung Yoon:
A Framework for Service Convergence via Device Cooperation. HCI (6) 2009: 738-747
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