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A. Guilhaume

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2000 – 2009

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2004
[j3]
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Philippe Galy, V. Berland, A. Guilhaume, F. Blanc, J. P. Chante:
Experimental measurements and 3D simulation of the parasitic lateral bipolar transistor triggering within a single finger gg-nMOS under ESD. Microelectron. Reliab. 44(9-11): 1775-1780 (2004)
2002
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Philippe Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc:
Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. Microelectron. Reliab. 42(9-11): 1299-1302 (2002)
2001
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A. Guilhaume, Philippe Galy, J. P. Chante, B. Foucher, F. Blanc:
Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. Microelectron. Reliab. 41(9-10): 1433-1437 (2001)

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