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K. E. Newman

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1990 – 1999

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1998
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David C. Keezer, K. E. Newman, John S. Davis:
Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233
1997
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K. E. Newman, David C. Keezer:
A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378

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