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William R. Mann

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2000 – 2009

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2008
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William R. Mann:
Wafer Test Methods to Improve Semiconductor Die Reliability. IEEE Des. Test Comput. 25(6): 528-537 (2008)
2004
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William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz:
The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195

1980 – 1989

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1989
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William R. Mann:
R96MFX Test Strategy. ITC 1989: 611-614

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