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ORCIDFrédéric Verdier
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2010 – 2019
- 2018
[c2]Frédéric Verdier, Abdelhak-Djamel Seriai
, Raoul Taffo Tiam:
Reusing Platform-specific Models in Model-Driven Architecture for Software Product Lines. MODELSWARD 2018: 106-116- [c1]Frédéric Verdier, Abdelhak-Djamel Seriai, Raoul Taffo Tiam:
Combining Model-Driven Architecture and Software Product Line Engineering: Reuse of Platform-Specific Assets. MODELSWARD (Revised Selected Papers) 2018: 430-454 - 2012
- [j6]Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier:
A methodological approach for predictive reliability: Practical case studies. Microelectron. Reliab. 52(12): 3035-3042 (2012)
2000 – 2009
- 2004
- [j5]Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto:
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44(9-11): 1299-1304 (2004) - [j4]Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé:
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44(9-11): 1337-1342 (2004) - 2003
- [j3]Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43(7): 1125-1136 (2003) - [j2]Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43(9-11): 1743-1749 (2003) - 2001
- [j1]Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, André Touboul, P. Huguet, R. Bonnet, G. Pataut:
Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectron. Reliab. 41(9-10): 1573-1578 (2001)
Coauthor Index
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