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Yu Cai 0001
Person information
- affiliation: Carnegie Mellon University, Department of Electrical and Computer Engineering, Pittsburgh, PA, USA
Other persons with the same name
- Yu Cai — disambiguation page
- Yu Cai 0002 — Michigan Technological University, College of Computing, Houghton, MI, USA
- Yu Cai 0003 — Booz and Company, Beijing, China (and 1 more)
- Yu Cai 0004 — Dalian University of Technology, School of Mathematical Sciences, Dalian, China
- Yu Cai 0005
— Hong Kong University of Science and Technology, Department of Electronic and Computer Engineering, Hong Kong
- Yu Cai 0006
— Nanjing University, School of Geography and Ocean Science, Jiangsu Provincial Key Laboratory of Geographic Information Science and Technology, Nanjing, China
- Yu Cai 0007
— Zhejiang University, College of Control Science and Engineering, State Key Laboratory of Industrial Control Technology, Hangzhou, China
- Yu Cai 0008
— Shanghai Jiao Tong University, School of Design, Shanghai, China
- Yu Cai 0009
— Hubei University of Chinese Medicine, College of Pharmacy, Wuhan, China
- Yu Cai 0010
— University of Shanghai for Science and Technology, College of Communication and Art Design, Shanghai, China
- Yu Cai 0011
— South-Central Minzu University, School of Biomedical Engineering, Wuhan, China
- Yu Cai 0012
— Shanghai Howsome Biotech Co., Ltd, China
- Yu Cai 0013
— South China University of Technology, School of Electric Power, Guangzhou, China
- Yu Cai 0014
— Zhejiang University, Hangzhou, China
- Yu Cai 0015 — Zhejiang University, Department of Biomedical Engineering & Instrument Science, Biosensor National Special Laboratory, Hangzhou, China
- Yu Cai 0016
— Hohai University, College of Internet of Things Engineering, Changzhou, China
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Journal Articles
- 2018
- [j5]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. Proc. ACM Meas. Anal. Comput. Syst. 2(3): 37:1-37:48 (2018) - 2017
- [j4]Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu:
Improving the reliability of chip-off forensic analysis of NAND flash memory devices. Digit. Investig. 20 Supplement: S1-S11 (2017) - [j3]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives. Proc. IEEE 105(9): 1666-1704 (2017) - 2016
- [j2]Yixin Luo
, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory. IEEE J. Sel. Areas Commun. 34(9): 2294-2311 (2016) - 2006
- [j1]Xi Chen, Yang Xiao
, Yu Cai, Jianhua Lu, Zucheng Zhou:
An energy diffserv and application-aware MAC scheduling for VBR streaming video in the IEEE 802.15.3 high-rate wireless personal area networks. Comput. Commun. 29(17): 3516-3526 (2006)
Conference and Workshop Papers
- 2018
- [c15]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. HPCA 2018: 504-517 - [c14]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. SIGMETRICS (Abstracts) 2018: 106 - 2017
- [c13]Yu Cai, Saugata Ghose, Yixin Luo, Ken Mai, Onur Mutlu, Erich F. Haratsch:
Vulnerabilities in MLC NAND Flash Memory Programming: Experimental Analysis, Exploits, and Mitigation Techniques. HPCA 2017: 49-60 - 2015
- [c12]Yu Cai, Yixin Luo, Saugata Ghose, Onur Mutlu:
Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery. DSN 2015: 438-449 - [c11]Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu:
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery. HPCA 2015: 551-563 - [c10]Yu Cai, Ken Mai, Onur Mutlu:
Comparative evaluation of FPGA and ASIC implementations of bufferless and buffered routing algorithms for on-chip networks. ISQED 2015: 475-484 - [c9]Yixin Luo, Yu Cai, Saugata Ghose, Jongmoo Choi, Onur Mutlu:
WARM: Improving NAND flash memory lifetime with write-hotness aware retention management. MSST 2015: 1-14 - 2014
- [c8]Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Osman S. Unsal, Adrián Cristal, Ken Mai:
Neighbor-cell assisted error correction for MLC NAND flash memories. SIGMETRICS 2014: 491-504 - 2013
- [c7]Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai:
Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling. DATE 2013: 1285-1290 - [c6]Yu Cai, Onur Mutlu, Erich F. Haratsch, Ken Mai
:
Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation. ICCD 2013: 123-130 - 2012
- [c5]Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai:
Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis. DATE 2012: 521-526 - [c4]Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Adrián Cristal
, Osman S. Ünsal
, Ken Mai
:
Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime. ICCD 2012: 94-101 - 2011
- [c3]Yu Cai, Erich F. Haratsch, Mark P. McCartney, Ken Mai
:
FPGA-Based Solid-State Drive Prototyping Platform. FCCM 2011: 101-104 - [c2]Yu Cai, Erich F. Haratsch, Mark P. McCartney, Mudit Bhargava, Ken Mai:
FPGA-based nand flash memory error characterization and solid-state drive prototyping platform (abstract only). FPGA 2011: 284 - 2006
- [c1]Wei Yu, Xingjie Liu, Yu Cai, Zucheng Zhou:
An Application-aware Delayed-ACK for Video Streaming over IEEE 802.15.3 WPANs. VTC Spring 2006: 1318-1322
Informal and Other Publications
- 2018
- [i6]Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Saugata Ghose, Onur Mutlu:
Experimental Characterization, Optimization, and Recovery of Data Retention Errors in MLC NAND Flash Memory. CoRR abs/1805.02819 (2018) - [i5]Yu Cai, Yixin Luo, Saugata Ghose, Erich F. Haratsch, Ken Mai, Onur Mutlu:
Read Disturb Errors in MLC NAND Flash Memory. CoRR abs/1805.03283 (2018) - [i4]Yu Cai, Saugata Ghose, Yixin Luo, Ken Mai, Onur Mutlu, Erich F. Haratsch:
Characterizing, Exploiting, and Mitigating Vulnerabilities in MLC NAND Flash Memory Programming. CoRR abs/1805.03291 (2018) - [i3]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. CoRR abs/1807.05140 (2018) - 2017
- [i2]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives. CoRR abs/1706.08642 (2017) - [i1]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Errors in Flash-Memory-Based Solid-State Drives: Analysis, Mitigation, and Recovery. CoRR abs/1711.11427 (2017)
Coauthor Index
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