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Alvin Jee
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2000 – 2009
- 2002
- [c6]Alvin Jee:
Defect-Oriented Analysis of Memory BIST Tests. IOLTW 2002: 201-205 - [c5]Mark Craig, Alvin Jee, Prashant Maniar:
An Integrated Approach to Yield Loss Characterization. ITC 2002: 350-356 - [c4]Alvin Jee:
Defect-Oriented Analysis of Memory BIST Tests. MTDT 2002: 7-11 - 2001
- [j1]Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu:
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Des. Test Comput. 18(3): 28-39 (2001) - 2000
- [c3]Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri:
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28
1990 – 1999
- 1997
- [c2]Alvin Jee, F. Joel Ferguson:
A methodolgy for characterizing cell testability. VTS 1997: 384-390 - 1993
- [c1]Alvin Jee, F. Joel Ferguson:
Carafe: an inductive fault analysis tool for CMOS VLSI circuits. VTS 1993: 92-98
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last updated on 2024-04-24 23:06 CEST by the dblp team
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