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Jean-François Naviner
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2010 – 2019
- 2016
- [j18]Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner
, You Wang, Mariem Slimani, Jean-François Naviner
:
Efficient reliability evaluation methodologies for combinational circuits. Microelectron. Reliab. 64: 19-25 (2016) - 2015
- [j17]Hao Cai, You Wang, Kaikai Liu, Lirida Alves de Barros Naviner
, Hervé Petit, Jean-François Naviner
:
Cross-layer investigation of continuous-time sigma-delta modulator under aging effects. Microelectron. Reliab. 55(3-4): 645-653 (2015) - 2014
- [c32]Lirida A. B. Naviner
, Kaikai Liu, Hao Cai, Jean-François Naviner
:
Efficient computation of combinational circuits reliability based on probabilistic transfer matrix. ICICDT 2014: 1-4 - [c31]Samuel N. Pagliarini
, Lirida A. B. Naviner
, Jean-François Naviner
, Dhiraj K. Pradhan:
A hybrid reliability assessment method and its support of sequential logic modelling. IOLTS 2014: 182-183 - 2013
- [j16]Samuel N. Pagliarini
, Arwa Ben Dhia, Lirida Alves de Barros Naviner
, Jean-François Naviner
:
SNaP: A novel hybrid method for circuit reliability assessment under multiple faults. Microelectron. Reliab. 53(9-11): 1230-1234 (2013) - [c30]Kaikai Liu, Hao Cai, Ting An, Lirida A. B. Naviner
, Jean-François Naviner
, Hervé Petit:
Reliability analysis of combinational circuits with the influences of noise and single-event transients. DFTS 2013: 218-223 - [c29]Kaikai Liu, Ting An, Hao Cai, Lirida A. B. Naviner
, Jean-François Naviner
, Hervé Petit:
A general cost-effective design structure for probabilistic-based noise-tolerant logic functions in nanometer CMOS technology. EUROCON 2013: 1829-1836 - [c28]Samuel N. Pagliarini
, Lirida A. B. Naviner
, Jean-François Naviner
:
Single event transient mitigation through pulse quenching: Effectiveness at circuit level. ICECS 2013: 121-124 - [c27]Samuel N. Pagliarini
, Tian Ban, Lirida A. B. Naviner
, Jean-François Naviner
:
Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis. MWSCAS 2013: 113-116 - [c26]Hao Cai, Hervé Petit, Jean-François Naviner
:
A fast reliability-aware approach for analogue integrated circuits based on Pareto fronts. NEWCAS 2013: 1-4 - [c25]Samuel N. Pagliarini
, Lirida A. B. Naviner, Jean-François Naviner
:
Selective hardening against multiple faults employing a net-based reliability analysis. NEWCAS 2013: 1-4 - 2012
- [j15]Hao Cai, Hervé Petit, Jean-François Naviner
:
A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and Systems. J. Low Power Electron. 8(5): 697-705 (2012) - [j14]Samuel N. Pagliarini
, G. G. dos Santos, Lirida Alves de Barros Naviner, Jean-François Naviner
:
Exploring the feasibility of selective hardening for combinational logic. Microelectron. Reliab. 52(9-10): 1843-1847 (2012) - [c24]Samuel N. Pagliarini
, Arwa Ben Dhia, Lirida Alves de Barros Naviner
, Jean-François Naviner
:
Automatic selective hardening against soft errors: A cost-based and regularity-aware approach. ICECS 2012: 753-756 - [c23]Samuel Nascimento Pagliarini
, Lirida A. B. Naviner
, Jean-François Naviner
:
Selective hardening methodology for combinational logic. LATW 2012: 1-6 - [c22]Kaikai Liu, Tian Ban, Lirida A. B. Naviner
, Jean-François Naviner
:
Reliability analysis of a Reed-Solomon decoder. MWSCAS 2012: 438-441 - 2011
- [j13]Pietro Maris Ferreira
, Hervé Petit, Jean-François Naviner
:
A synthesis methodology for AMS/RF circuit reliability: Application to a DCO design. Microelectron. Reliab. 51(4): 765-772 (2011) - [j12]Hao Cai, Hervé Petit, Jean-François Naviner
:
Reliability aware design of low power continuous-time sigma-delta modulator. Microelectron. Reliab. 51(9-11): 1449-1453 (2011) - [j11]Lirida A. B. Naviner
, Jean-François Naviner
, G. G. dos Santos Jr., Elaine Crespo Marques, Nilson M. Paiva Jr.:
FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL level. Microelectron. Reliab. 51(9-11): 1459-1463 (2011) - [c21]Pietro Maris Ferreira
, Hervé Petit, Jean-François Naviner
:
A new synthesis methodology for reliable RF front-end Design. ISCAS 2011: 2926-2929 - 2010
- [j10]G. G. dos Santos, Elaine Crespo Marques, Lirida A. B. Naviner
, Jean-François Naviner
:
Using error tolerance of target application for efficient reliability improvement of digital circuits. Microelectron. Reliab. 50(9-11): 1219-1222 (2010) - [j9]Elaine Crespo Marques, Lirida A. B. Naviner
, Jean-François Naviner
:
An efficient tool for reliability improvement based on TMR. Microelectron. Reliab. 50(9-11): 1247-1250 (2010) - [c20]Pietro Maris Ferreira
, Hervé Petit, Jean-François Naviner
:
AMS and RF design for reliability methodology. ISCAS 2010: 3657-3660 - [c19]Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner
, Jean-François Naviner
:
On evaluating the signal reliability of self-checking arithmetic circuits. SBCCI 2010: 109-114
2000 – 2009
- 2008
- [j8]Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner
, Jean-François Naviner
:
Signal probability for reliability evaluation of logic circuits. Microelectron. Reliab. 48(8-9): 1586-1591 (2008) - [j7]Maí Correia R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner
, Jean-François Naviner
:
Relevant metrics for evaluation of concurrent error detection schemes. Microelectron. Reliab. 48(8-9): 1601-1603 (2008) - [j6]David Camarero, Karim Ben Kalaia, Jean-François Naviner
, Patrick Loumeau:
Mixed-Signal Clock-Skew Calibration Technique for Time-Interleaved ADCs. IEEE Trans. Circuits Syst. I Regul. Pap. 55-I(11): 3676-3687 (2008) - [c18]Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida A. B. Naviner
, Jean-François Naviner
:
Reliability analysis of logic circuits based on signal probability. ICECS 2008: 670-673 - [c17]Maí Correia R. de Vasconcelos, Denis Teixeira Franco, Lirida A. B. Naviner
, Jean-François Naviner
:
On the output events in concurrent error detection schemes. ICECS 2008: 978-981 - [c16]Aamir Riaz, Jean-François Naviner
, Van Tam Nguyen:
A Novel Approach to Non Coherent UWB Reception. IMTIC 2008: 100-109 - [i1]Lirida Alves de Barros Naviner, Jean-François Naviner, Denis Teixeira Franco, Maí Correia R. de Vasconcelos:
Methods and Metrics for Reliability Assessment. Fault-Tolerant Distributed Algorithms on VLSI Chips 2008 - 2006
- [j5]Denis Teixeira Franco, Jean-François Naviner
, Lirida A. B. Naviner
:
Yield and reliability issues in nanoelectronic technologies. Ann. des Télécommunications 61(11-12): 1422-1457 (2006) - [c15]Rayan Mina, Jean-Charles Grasset, Jean-François Naviner
:
Impact of charge injection on system-level performance of a discrete-time GSM receiver. ICECS 2006: 494-497 - [c14]Van Tam Nguyen, Patrick Loumeau, Jean-François Naviner:
High-pass Delta Sigma modulator: from system analysis to circuit design. ISCAS 2006 - [c13]Van Tam Nguyen, Patrick Loumeau, Jean-François Naviner:
A CMOS implementation of time-interleaved high-pass Delta Sigma modulator. ISCAS 2006 - 2005
- [c12]David Camarero, Jean-François Naviner
, Patrick Loumeau:
Calibration of sampling instants in a multiple channel time-interleaved analog-to-digital converter. ICECS 2005: 1-4 - 2004
- [j4]Jean-François Naviner, Amara Amara:
Systems-on-chip for telecommunications. Ann. des Télécommunications 59(7-8): 755-758 (2004) - [c11]David Camarero, Jean-François Naviner
, Patrick Loumeau:
Digital background and blind calibration for clock skew error in time-interleaved analog-to-digital converters. SBCCI 2004: 228-232 - 2003
- [j3]Sebastian Yuri Cavalcanti Catunda
, Jean-François Naviner
, Gurdip Singh Deep, Raimundo Carlos Silvério Freire
:
Designing a programmable analog signal conditioning circuit without loss of measurement range. IEEE Trans. Instrum. Meas. 52(5): 1482-1487 (2003) - [c10]Van-Tam Nguyen, Patrick Loumeau, Jean-François Naviner:
Temporel and spectral analysis of time interleaved high pass sigma delta converter. ICASSP (2) 2003: 453-456 - 2002
- [j2]Patrick Loumeau, Jean-François Naviner, Hervé Petit, Lirida A. B. Naviner, Patricia Desgreys:
Analog to digital conversion: technical aspects. Ann. des Télécommunications 57(5-6): 338-385 (2002) - [c9]Van Tam Nguyen, Patrick Loumeau, Jean-François Naviner:
An interleaved delta-sigma analog to digital converter with digital correction. ICASSP 2002: 4193 - [c8]Van Tam Nguyen, Patrick Loumeau, Jean-François Naviner
:
A time-interleaved chopper-stabilized delta-sigma analog to digital converter. ICECS 2002: 299-302 - [c7]Van Tam Nguyen, Patrick Loumeau, Jean-François Naviner
:
Analysis of time-interleaved delta-sigma analog to digital converter. VTC Spring 2002: 1594-1597 - 2001
- [c6]Elizabeth Colin
, Patrick Loumeau, Lirida A. B. Naviner, Jean-François Naviner:
Antialiasing filtering influences on ADC specifications for radio receivers. ICECS 2001: 1469-1472 - [c5]Elizabeth de Lira Mendes, Patrick Loumeau, Jean-François Naviner
:
A switched-current sample and hold circuit for low frequency applications. ISCAS (1) 2001: 452-455 - [c4]Elizabeth Colin
, Lirida A. B. Naviner
, Patrick Loumeau, Jean-François Naviner
:
Trade-off between antialiasing filter and analog-to-digital converters specifications in homodyne radio frequency receivers. VTC Fall 2001: 2351-2354
1990 – 1999
- 1999
- [c3]T. Vasseaux, B. Huyart, Patrick Loumeau, Jean-François Naviner:
A track&hold-mixer for direct-conversion by subsampling. ISCAS (4) 1999: 584-587 - 1994
- [c2]Jean-Claude Dufourd, Jean-François Naviner:
An Optimizable Model for Process Independent Symbolic Design. EDAC-ETC-EUROASIC 1994: 660 - 1993
- [j1]Jean-François Naviner
, Jean-Claude Dufourd:
Préforme/aGAPE: a synergy between symbolic cell design and assembly. Microprocess. Microprogramming 37(1-5): 11-14 (1993) - 1990
- [c1]Jean-Claude Dufourd, Jean-François Naviner, Francis Jutand:
Preform: A Process Independent Symbolic Layout System. ICCAD 1990: 248-251
Coauthor Index
aka: Lirida Alves de Barros Naviner
aka: Samuel N. Pagliarini
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