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David R. Akeson

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Conference and Workshop Papers

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1998
[c2]
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Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson:
Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-495
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Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill:
A highly testable and diagnosable fabrication process test chip. ITC 1998: 853-861

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