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2020 – today
- 2023
[j8]Danijel Dankovic
, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic:
The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering. IEEE Trans. Educ. 66(2): 146-155 (2023)- 2022
- [j7]Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic:
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31(18): 2240003:1-2240003:25 (2022)
2010 – 2019
- 2019
- [j6]Ljubomir Vracar, Milan D. Stojanovic, Aleksandar S. Stanimirovic, Zoran Prijic:
Influence of Encryption Algorithms on Power Consumption in Energy Harvesting Systems. J. Sensors 2019: 8520562:1-8520562:9 (2019) - 2018
- [j5]Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, D. Spassov, Ninoslav Stojadinovic:
A review of pulsed NBTI in P-channel power VDMOSFETs. Microelectron. Reliab. 82: 28-36 (2018) - [j4]Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic:
NBTI and irradiation related degradation mechanisms in power VDMOS transistors. Microelectron. Reliab. 88-90: 135-141 (2018) - 2013
- [j3]Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic:
An Electromechanical Approach to a Printed Circuit Board Design Course. IEEE Trans. Educ. 56(4): 470-477 (2013) - 2011
- [j2]Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic:
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. Microelectron. Reliab. 51(9-11): 1540-1543 (2011) - 2010
- [j1]Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic:
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress. Microelectron. Reliab. 50(9-11): 1278-1282 (2010)
Coauthor Index
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