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Simona Podda
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2010 – 2019
- 2013
- [j12]Massimo Vanzi, Simona Podda, Elodia Musu, Robert Cao:
XEBIC at the Dual Beam. Microelectron. Reliab. 53(9-11): 1399-1402 (2013)
2000 – 2009
- 2008
- [j11]Ruggero Pintus
, Simona Podda, Massimo Vanzi:
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. IEEE Trans. Instrum. Meas. 57(5): 989-996 (2008) - 2006
- [j10]Matteo Meneghini
, Simona Podda, A. Morelli, Ruggero Pintus
, L. Trevisanello, Gaudenzio Meneghesso
, Massimo Vanzi, Enrico Zanoni
:
High brightness GaN LEDs degradation during dc and pulsed stress. Microelectron. Reliab. 46(9-11): 1720-1724 (2006) - 2005
- [j9]Ruggero Pintus
, Simona Podda, Massimo Vanzi:
Image alignment for 3D reconstruction in a SEM. Microelectron. Reliab. 45(9-11): 1581-1584 (2005) - 2004
- [j8]Ruggero Pintus
, Simona Podda, Francesca Mighela, Massimo Vanzi:
Quantitative 3D reconstruction from BS imaging. Microelectron. Reliab. 44(9-11): 1547-1552 (2004) - [j7]Simona Podda, G. Cassanelli, Fausto Fantini
, Massimo Vanzi:
Failure Analysis of RuO2 Thick Film Chip Resistors. Microelectron. Reliab. 44(9-11): 1763-1767 (2004) - 2003
- [j6]Gaudenzio Meneghesso
, S. Levada, Enrico Zanoni
, Gaetano Scamarcio
, Giovanna Mura
, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich:
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43(9-11): 1737-1742 (2003) - 2002
- [j5]Gaudenzio Meneghesso, A. Cocco, Giovanna Mura
, Simona Podda, Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002) - [j4]Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura
, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
:
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42(9-11): 1303-1306 (2002) - [j3]M. Giglio, G. Martines, Giovanna Mura
, Simona Podda, Massimo Vanzi:
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42(9-11): 1311-1315 (2002) - [j2]C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi:
A specimen-current branching approach for FA of long Electromigration test lines. Microelectron. Reliab. 42(9-11): 1715-1718 (2002) - 2001
- [j1]Gaudenzio Meneghesso
, Simona Podda, Massimo Vanzi:
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. Microelectron. Reliab. 41(9-10): 1609-1614 (2001)
Coauthor Index
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