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M. Zecri

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2000 – 2009

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2003
[j2]
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  - journals/mr/ZecriBGNBN03
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M. Zecri, P. Besse, Philippe Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier:
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43(9-11): 1551-1556 (2003)
2002
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Oliver Perat, Jean-Marie Dorkel, Emmanuel Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi:
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42(7): 1053-1058 (2002)

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