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E. Nisenboim

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2024
[c1]
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  dblp key:
  - conf/irps/CelioSNPNLNKPRJSSLLSY24
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  - https://dblp.org/rec/conf/irps/CelioSNPNLNKPRJSSLLSY24
K. C. Celio, S. Sen, E. Nisenboim, P. M. Pardy, B. Nguyen, V. Le, W. Nolting, S. Kumar, C. A. Peterson, A. Raveh, K. Johnson, B. Stripe, F. Su, M. Lun, S. Lewis, R. I. Spink, W. Yun:
Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and Post-Silicon Debug. IRPS 2024: 1-5

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