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X. Boddaert

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2000 – 2009

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2003
[j2]
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Jean-Luc Goudard, X. Boddaert, J. Périnet, Dominique Laffitte:
Reliability of optoelectronics components: towards new qualification practices. Microelectron. Reliab. 43(9-11): 1767-1769 (2003)
2002
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Jean-Luc Goudard, P. Berthier, X. Boddaert, Dominique Laffitte, J. Périnet:
New qualification approach for optoelectronic components. Microelectron. Reliab. 42(9-11): 1307-1310 (2002)

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