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Donghyun Kim 0005
Person information
- affiliation: Sungkyunkwan University, Department of Smart Factory Convergence, Suwon, Republic of Korea
Other persons with the same name
- Donghyun Kim (aka: DongHyun Kim, Dong-Hyun Kim, Dong Hyun Kim) — disambiguation page
- Donghyun Kim 0001
— Georgia State University, Atlanta, GA, USA (and 4 more)
- Donghyun Kim 0002
— Massachusetts Institute of Technology, Cambridge, MA, USA (and 1 more)
- Donghyun Kim 0003
— Hanwha Systems Co., Ltd., Yongin Research and Development Center, South Korea
- Donghyun Kim 0004
— Korea Advanced Institute of Science and Technology (KAIST), Electrical Engineering Department, Daejeon, South Korea
- Donghyun Kim 0006 — MIT-IBM Watson AI Lab (and 1 more)
- Donghyun Kim 0007
— Yahoo! Inc, Yahoo Research, Sunnyvale, CA, USA (and 1 more)
- Donghyun Kim 0008
(aka: Dong-Hyun Kim 0008) — Yonsei University, Department of Electrical and Electronic Engineering, College of Engineering, Seoul, Korea (and 1 more)
- Donghyun Kim 0009
— Hanyang University, Department of Electrical Engineering, Ansan, Korea
- Donghyun Kim 0010 (aka: Dong Hyun Kim 0010) — Yonsei University, Department of Electrical and Electronic Engineering, Seoul, Korea
- Donghyun Kim 0012 (aka: Dong Hyun Kim 0012) — NAVER Corp, Seongnam, South Korea
- Donghyun Kim 0013
— Yonsei University, School of Electrical and Electronic Engineering, Seoul, Korea (and 2 more)
- Donghyun Kim 0014 — Qualcomm, Inc., San Diego, CA, USA (and 1 more)
- Donghyun Kim 0016 — University of Illinois Urbana-Champaign, USA
- Dong-Hyun Kim 0011
(aka: Dong Hyun Kim 0011) — Pusan National University, Department of Information Convergence Engineering, Busan, Korea
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2020 – today
- 2023
- [c3]Donghyun Kim, Seokju Oh, Jeongdae Kim, Jongpil Jeong:
Abnormal Data Classification Based on SSA-AELSTM. ICCSCI 2023: 867-873 - 2021
- [j1]Donghyun Kim
, Byungjun Park, Junhyung Moon, Jaeen Lee, Jongpil Jeong
:
Design and Performance Analysis for Edge Intelligence-Based F-PMIPv6 Mobility Support for Smart Manufacturing. Wirel. Commun. Mob. Comput. 2021: 9970942:1-9970942:14 (2021) - [c2]Donghyun Kim, Jaegyeong Cha, Seokju Oh, Jongpil Jeong:
AnoGAN-Based Anomaly Filtering for Intelligent Edge Device in Smart Factory. IMCOM 2021: 1-6 - 2020
- [c1]Jaegyeong Cha, Seokju Oh, Donghyun Kim, Jongpil Jeong:
A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. IDSTA 2020: 28-33
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last updated on 2024-08-29 21:55 CEST by the dblp team
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